Continuous Renal Replacement Therapy Circuit Lifespan in Intensive Care Patients

The goal of this retrospective observational study is to evaluate how long continuous renal replacement therapy (CRRT) circuits remain in use in adult intensive care unit patients and to describe how CRRT pressure measurements change over time. The main questions it aims to answer are: Are higher maximum and mean transmembrane pressure (TMP) values associated with longer CRRT circuit lifespan? Do time-normalized pressure trajectories and cumulative TMP burden differ between circuits with different lifespans? Do access pressure patterns influence the relationship between pressure measurements and circuit lifespan? Researchers will analyze archived CRRT device log files, including access pressure, filter pressure, effluent pressure, return pressure, and TMP measurements. No additional procedures, interventions, or study visits will be required. No directly identifiable patient information will be included in the analytical dataset.

Inclusion Criteria: * Archived CRRT treatment sessions performed in adult intensive care unit patients. * CRRT sessions recorded on the Prismaflex platform and available as LOX device log files. * Sessions with a circuit lifespan of at least 1 hour, defined as the time between the first and last valid pressure recording. * Sessions containing sufficient time-stamped pressure data for analysis, including at least 60 valid pressure measurements. * Sessions with available pressure recordings for the relevant variables, including transmembrane pressure, access pressure, filter pressure, effluent pressure, and/or return pressure. * Sessions with adequate data integrity and chronologically interpretable pressure records. Exclusion Criteria: * CRRT sessions with a runtime of less than 1 hour. * Sessions with missing pressure tables. * Sessions with fewer than 60 pressure measurements. * Sessions with missing or incomplete primary device records. * Sessions with missing timestamps or pressure records that cannot be ordered chronologically. * Sessions with inadequate pressure-data density for trajectory analysis. * Sessions with major data-integrity problems that prevent reliable calculation of circuit lifespan or pressure-derived variables. * Duplicate or otherwise unusable device-log records.